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Dr. James LeBlanc
at GE Research
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 13 March 2007 Paper
Multi-source inverse geometry CT: a new system concept for x-ray computed tomography
Proceedings Volume 6510, 65100H (2007) https://doi.org/10.1117/12.712854
KEYWORDS: Sensors, X-ray computed tomography, X-rays, X-ray detectors, Spatial resolution, Image quality, Reconstruction algorithms, Computing systems, Monte Carlo methods, Modulation
Proceedings Article | 28 June 2001 Paper
Modeling the x-ray energy characteristics of DQE for full-field digital mammography
J. Eric Tkaczyk, James LeBlanc, Robert Nevin, Gregory Kautz, Douglas Albagli, John Sandrik, Paul Granfors
Proceedings Volume 4320, (2001) https://doi.org/10.1117/12.430883
KEYWORDS: Sensors, Modulation transfer functions, X-rays, Scintillators, Spatial frequencies, X-ray detectors, Optical transfer functions, Data modeling, Quantum efficiency, Aluminum
Proceedings Article | 28 June 2001 Paper
Cone-beam volumetric CT imagers: simulations for rapid prototype system design and prediciton of image quality
Proceedings Volume 4320, (2001) https://doi.org/10.1117/12.430860
KEYWORDS: Sensors, Image quality, X-rays, X-ray computed tomography, X-ray detectors, 3D modeling, Imaging systems, Systems modeling, Image quality standards, Computer simulations
Conference Committee Involvement (1)
SPIE Environmental Nanotechnology Online Conference
15 October 2008 | Online Conference, United States
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