Dr. Jana Clerico
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 May 2005 Paper
Michael Darwin, Pinar Kinikoglu, Yongqiang Liu, Kristin Darwin, Jana Clerico
Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.599660
KEYWORDS: Semiconducting wafers, Inspection, Image processing, Lithography, Image classification, Manufacturing, Classification systems, Optical lithography, Particles, Thin film coatings

Proceedings Article | 24 May 2004 Paper
Gary Jiang, Timothy Sun, Donald Pelcher, Jana Clerico, Jui-Ping Li, Yi-Ru Chen
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.535264
KEYWORDS: Etching, Metrology, Reflectivity, Deep ultraviolet, Reflectometry, Transmission electron microscopy, Semiconducting wafers, Ellipsometry, Process control, Silicon

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