Dr. Jay Theodore Cremer
Chief Scientist at Adelphi Technology Inc
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 9 September 2019 Presentation + Paper
Proceedings Volume 11108, 111080Q (2019) https://doi.org/10.1117/12.2527752
KEYWORDS: X-rays, Gamma radiation, X-ray imaging, Hard x-rays, Photons, Collimators, Glasses, Compton scattering, Capillaries, X-ray optics

Proceedings Article | 24 September 2007 Paper
C. Gary, H. Park, R. Pantell, Y. Dudchik, L. Lombardo, J. Cremer
Proceedings Volume 6707, 67070R (2007) https://doi.org/10.1117/12.735645
KEYWORDS: X-rays, X-ray optics, Tomography, X-ray imaging, Lenses, Imaging systems, X-ray detectors, Sensors, Radiography, Spherical lenses

Proceedings Article | 7 December 2006 Paper
Proceedings Volume 5974, 597417 (2006) https://doi.org/10.1117/12.640106
KEYWORDS: X-rays, Epoxies, Free electron lasers, Absorption, Lens design, Capillaries, Spherical lenses, Confocal microscopy, Optical components, X-ray lasers

Proceedings Article | 21 September 2005 Paper
Proceedings Volume 5923, 59230A (2005) https://doi.org/10.1117/12.624972
KEYWORDS: Sensors, Scintillators, Modulation transfer functions, Charge-coupled devices, Signal to noise ratio, CCD image sensors, Fiber optics, Signal detection, Spatial frequencies, Imaging systems

Proceedings Article | 26 October 2004 Paper
Jay Cremer, Melvin Piestrup, Charles Gary, Heungsup Park, Richard Pantell
Proceedings Volume 5541, (2004) https://doi.org/10.1117/12.565715
KEYWORDS: Scattering, Absorption, Sensors, Spherical lenses, Phase shifts, Aluminum, Signal attenuation, Image resolution, Cadmium, Refraction

Showing 5 of 14 publications
Conference Committee Involvement (1)
Penetrating Radiation Systems and Applications V
7 August 2003 | San Diego, California, United States
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