Jeffrey T. Meier
Electro Optical Engineer at US Army Redstone Technical Test Ctr
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 28 October 2020
Jeff Meier, Kenny N. M. Emmanuel, Zach Whitfield, Matthew Hester, Patrick O'Shea, Ronald Driggers, Carl Halford, Orges Furxhi
OE, Vol. 59, Issue 10, 103108, (October 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.10.103108
KEYWORDS: Black bodies, Sensors, Calibration, Radiometry, Infrared radiation, Target detection, Nonuniformity corrections, Infrared sensors, Infrared search and track, Signal to noise ratio

Proceedings Article | 25 October 1999 Paper
Proceedings Volume 3754, (1999) https://doi.org/10.1117/12.366355
KEYWORDS: Polarization, Polarizers, Diffractive optical elements, Staring arrays, Chromium, Image filtering, Optical filters, Molybdenum, Imaging systems, Silicon

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