In the emerging field of twistronics, new electronic devices based on bilayer graphene have shown distinct electronic properties that depend on the rotational misalignment of one crystalline layer with respect to another. Given present methods of preparing these bilayers, there is always some uncertainty in the actual versus targeted twist angle of a specific bilayer that can only be resolved by measuring the moiré patterns that are unique to a specific twist angle. Traditional methods enabling such a measurement, Transmission Electron Microscopy and Scanning Tunneling Microscopy, impose serious restrictions on the types of substrates supporting the bilayers, which, in turn, constrains the subsequent fabrication of any devices. We report here a new, non-destructive method to measure moiré patterns of bilayer graphene deposited on any smooth substrate, using the scanning probe technique known as scanning microwave impedance microscopy (sMIM) which enables the simultaneous generation of localized topography, capacitance and conductance images with nanometer 1 scale resolution . Moiré patterns were observed in samples prepared on various substrates with twist angles ranging from 0.02 to 6.7 degrees, beyond which the moiré patterns are too small to be resolved by the sMIM probes. We present some possible reasons for the various contrast mechanisms. Addressing the problem of variations across a bilayer surface due to localized moiré distortions that result from the tensile and shear forces involved in transferring a twisted bilayer to a substrate, we demonstrate how sMIM can precisely map the twist angle distribution across the film, and enable direct device and circuit routing.
This paper presents a study (simulations) of coupling losses between adjacent waveguides made of tellurite glasses. These waveguides are designed to perform parametric amplifiers (PAs). PAs have some advantageous characteristics over the other optical amplifiers: they have broadband amplification bandwidth (depending on the dispersive characteristics of the waveguide), other all-optical functionalities, and can work at ultra-high bit rates (Pbit/s). PAs are based on the nonlinear phenomena of phase matched four-wave mixing between a strong pump and a weak signal. The parametric gain increases with the waveguide length, the pump power and the nonlinear coefficient of the waveguide. The best alternative to maximize the parametric gain is to reduce the pump power as much as possible, increasing the waveguide length and/or the nonlinear coefficient of the waveguide. The latter parameter can be enhanced by increasing the nonlinear refractive index of the material (n2) or by reducing the waveguide effective area. Here we perform waveguides made of tellurite because these glasses have an n2 that goes up to 30 x 10-19 m2/W. On the other hand, the waveguide length can be increased by using an Archimedean spiral design. This geometry allows obtaining long waveguides (~1 m) within a small area. Using the Finite Element Method we study the separation distance between adjacent waveguides in order to obtain coupling lengths higher than the waveguide length (total losses < 2 dB/m). The waveguide dimensions are optimized to obtain a monomode waveguide with dispersive characteristics to perform PAs (around ~1550 nm spectral region).
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