Dr. Jirí Vanek Profile

Dr. Jirí Vanek

at Brno Univ of Technology

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 24 September 2013 Paper

Luminescence radiation spectroscopy of silicon solar cells

R. Stojan, J. Vaněk, M. Malý, R. Gvritishvili, P. Tománek, O. Frantík

Proceedings Volume 8825, 88250T (2013) https://doi.org/10.1117/12.2024290

KEYWORDS: Luminescence, Polarization, Solar cells, Silicon solar cells, Solar radiation, Electroluminescence, Spectroscopy, Silicon, CCD cameras, Crystals

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Proceedings Article | 10 May 2012 Paper

Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells

Z. Chobola, M. Lunák, V. Juranková, J. Vanek, R. Barinka

Proceedings Volume 8431, 843129 (2012) https://doi.org/10.1117/12.945977

KEYWORDS: Solar cells, Diffusion, Spectroscopy, Diagnostics, Phosphorus, Standards development, Printing, Spectroscopes, Electroluminescence, Resistance

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Proceedings Article | 28 April 2010 Paper

Noise as characterization for GaSb-based laser diodes prepared by molecular beam epitaxy

Z. Chobola, M. Lunak, J. Vanek, E. Hulicius

Proceedings Volume 7720, 77202C (2010) https://doi.org/10.1117/12.854891

KEYWORDS: Semiconductor lasers, Resistance, Reliability, Molecular beam epitaxy, Diodes, Gallium antimonide, Laser applications, Physics, Semiconductors, Electronic components

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Proceedings Article | 20 August 2009 Paper

Diagnostic methods of solar cells in dependence on temperature

J. Dolensky, A. Vesely, J. Vanek, J. Hrozek

Proceedings Volume 7412, 74120U (2009) https://doi.org/10.1117/12.826135

KEYWORDS: Solar cells, Electroluminescence, CCD cameras, Temperature metrology, Diagnostics, Silicon, Diodes, Cameras, Infrared cameras, Testing and analysis

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Proceedings Article | 5 June 2008 Paper

Diffractive optical element spectroscopy of biomaterial surface

Vladimir Vetterl, Stanislav Hasoň, Heikki Tuononen, Martti Silvennoinen, Kari Myller, Jiri Vaněk, Raimo Silvennoinen

Proceedings Volume 7022, 702203 (2008) https://doi.org/10.1117/12.803903

KEYWORDS: Reflectivity, Diffractive optical elements, Titanium, Surface finishing, Sensors, Interfaces, Radon, Molecules, Refractive index, Polishing

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Proceedings Article | 22 June 2007 Paper

Usage of microplasma signal noise for solar cells diagnostic

Jiri Vanek, Pavel Koktavy, Kristyna Kubickova, Petr Sadovsky, Michal Raska

Proceedings Volume 6600, 660017 (2007) https://doi.org/10.1117/12.724585

KEYWORDS: Diodes, Solar cells, Interference (communication), Diagnostics, Silicon, Electroluminescence, Infrared cameras, CCD cameras, Oscilloscopes, Ionization

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Proceedings Article | 11 June 2007 Paper

Noise spectroscopy of new silicon solar cells with double-sided texture

Zdeněk Chobola, Vlasta Juránková, Jiří Vaněk, Radim Bařinka

Proceedings Volume 6600, 66001M (2007) https://doi.org/10.1117/12.724624

KEYWORDS: Silicon, Solar cells, Reliability, Resistance, Silicon solar cells, Semiconducting wafers, Diffusion, Etching, Silicon films, Manufacturing

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Proceedings Article | 23 May 2005 Paper

Low-frequency noise measurements used for semiconductors light active devices

Jiri Vanek, Zdenek Chobola, Vladimir Brzokoupil, Jiri Kazelle

Proceedings Volume 5844, (2005) https://doi.org/10.1117/12.609228

KEYWORDS: Solar cells, Resistance, Semiconductor lasers, Semiconductors, Diagnostics, Gallium antimonide, Diodes, Silicon, Reliability, Continuous wave operation

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Showing 5 of 8 publications

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