We study the total capacity requirements of span-restorable mesh network designs as the percentage of all possible dual failure combinations incident on a common node is increased. Our interest is in questions such as: Are there any guidelines or insights as to how many such SRLGs can be sustained before the capacity penalty becomes severe? Can we diagnose which SRLGs are the most limiting to overall network efficiency? When would it be worthwhile to take physical measures to eliminate a certain SRLG? In addressing these questions we provide a design formulation and procedure for planning any span-restorable network for a known set of SRLGs. One finding of interest is that if all dual failure combinations incident to a common node are allowed for in the design, then nearly all other dual span failure combinations (any two spans in the network) will also be restorable. We also produce experimental results showing how total capacity depends on the relative number or frequency of co-incident SRLGs and quantify how the type of SRLG will impact design costs.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.