Mr. John E. Thiel Profile

John E. Thiel

at Raytheon

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Publications (1)

Proceedings Article | 14 June 2023 Presentation + Paper

Sensitivity analysis of ResNet-based automatic target recognition performance using MuSES-generated EO/IR synthetic imagery

Mark Klein, Matthew Young, J. David Taylor, John Thiel, Corey Packard, Matthew Fox, Arvin Ignaci, John Zalewski, Alex Klaschus, Peter Rynes

Proceedings Volume 12529, 125290A (2023) https://doi.org/10.1117/12.2663571

KEYWORDS: Artificial intelligence, Machine learning, Education and training, Bidirectional reflectance transmission function, Automatic target recognition, Detection and tracking algorithms, Data modeling, Mid-IR, Sensors, Infrared imaging, Computer simulations

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