KEYWORDS: Sensors, Cameras, Microscopy, Light emitting diodes, Photodetectors, Signal to noise ratio, Time metrology, Statistical methods, Optical testing, Single photon
In modern single pixel microscopy techniques, like Nano-Illumination Microscopy, long measurement times can become a major issue, especially when imaging biological tissues with large field of view. Usually, light intensity measurements are performed with CMOS pixels, with typical integration times around tens of milliseconds. In this work, we propose to obtain a light intensity measurement indirectly by applying statistical techniques to the photon arrival times gathered with an SPAD photodetector. We will present how the different statistical measurements can be used to minimize the total acquisition time and minimize also the hardware required. In this work, with captures of 256 SPAD measurements, reducing measurement time from 50ms to 50us. The dynamic range is extended by combining multiple statistical techniques with standard intensity measurements. This paves the way to practical Nano-Illumination Microscopy and other single pixel microscopy techniques.
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