Dr. Jun-ichi Kato
Senior Research Scientist at RIKEN
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 15 October 2012 Paper
Proceedings Volume 8455, 84550K (2012) https://doi.org/10.1117/12.930161
KEYWORDS: Holograms, Silver, Holography, 3D image reconstruction, Diffraction, Metals, Silica, Photoresist materials, Dispersion, Modulation

Proceedings Article | 7 March 2006 Paper
Ichirou Yamaguchi, Jun-ichi Kato, Sohgo Ohta, Junko Mizuno
Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498395
KEYWORDS: Charge-coupled devices, Digital holography, 3D image reconstruction, Phase shifts, Image acquisition, Reconstruction algorithms, CCD cameras, Image resolution, Fringe analysis, 3D image processing

Proceedings Article | 22 December 2003 Paper
Sei Moriyasu, Peter Takacs, Jun-ichi Kato, Weimin Lin, Yutaka Yamagata, Hitoshi Ohmori
Proceedings Volume 5180, (2003) https://doi.org/10.1117/12.509457
KEYWORDS: Mirrors, Head, Beam steering, Control systems, Sensors, Prisms, Optics manufacturing, Ocean optics, Lens grinding equipment, X-rays

Proceedings Article | 19 November 2003 Paper
Ichirou Yamaguchi, Jun-ichi Kato, Hirokazu Matsuzaki
Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.525858
KEYWORDS: Digital holography, Phase shifts, Speckle, Digital imaging, Beam splitters, Mirrors, Charge-coupled devices, Ferroelectric materials, Optical engineering, Mechanical engineering

SPIE Journal Paper | 1 May 2003
Ichirou Yamaguchi, Jun-ichi Kato, Hirokazu Matsuzaki
OE, Vol. 42, Issue 05, (May 2003) https://doi.org/10.1117/12.10.1117/1.1566778
KEYWORDS: Digital holography, Phase shifts, Digital imaging, Imaging systems, Speckle, Interferometry, 3D image reconstruction, Charge-coupled devices, Mirrors, 3D image processing

Proceedings Article | 19 June 2002 Paper
Ichirou Yamaguchi, Jun-ichi Kato, Hirokazu Matsuzaki
Proceedings Volume 4778, (2002) https://doi.org/10.1117/12.473542
KEYWORDS: Digital holography, Phase shifts, Speckle, Digital imaging, Imaging systems, Interferometry, Charge-coupled devices, Surface roughness, Mechanical engineering, CCD cameras

Proceedings Article | 7 May 1999 Paper
Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347753
KEYWORDS: Interferometry, Phase shifts, Gold, Phase interferometry, Ferroelectric materials, Mirrors, Tunable lasers, Modulation, Wavelength tuning, CCD cameras

SPIE Journal Paper | 1 October 1996
OE, Vol. 35, Issue 10, (October 1996) https://doi.org/10.1117/12.10.1117/1.600956
KEYWORDS: Interferometers, Mirrors, Phase shifts, Sensors, Fringe analysis, Spatial filters, Computing systems, Feedback loops, Signal detection, Optical engineering

Proceedings Article | 18 September 1996 Paper
Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250763
KEYWORDS: Signal detection, Video, Fringe analysis, Spherical lenses, Interferometers, Spatial filters, Sensors, Semiconductor lasers, Moire patterns, Phase shifts

Proceedings Article | 1 September 1996 Paper
Proceedings Volume 2778, 27787I (1996) https://doi.org/10.1117/12.2299153

Proceedings Article | 12 December 1994 Paper
Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195917
KEYWORDS: Fringe analysis, Mirrors, Phase shifts, Signal processing, Interferometers, Video, Moire patterns, Feedback control, Ferroelectric materials, Phase shifting

Proceedings Article | 5 August 1994 Paper
Proceedings Volume 2321, (1994) https://doi.org/10.1117/12.182149

Proceedings Article | 1 January 1992 Paper
Proceedings Volume 1553, (1992) https://doi.org/10.1117/12.135300
KEYWORDS: Semiconductor lasers, Fringe analysis, Speckle, Phase shifts, Laser interferometry, Vibrometry, Modulation, Interferometers, Visibility, Light sources

Proceedings Article | 1 January 1992 Paper
Proceedings Volume 1553, (1992) https://doi.org/10.1117/12.135288
KEYWORDS: Sensors, Modulation, Reflectors, Semiconductor lasers, Signal detection, Laser energy, Signal processing, Laser resonators, Laser interferometry, Phase shifts

Showing 5 of 14 publications
Conference Committee Involvement (1)
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
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