Dr. Jun Guo
at Beijing Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2013 Paper
Jun Guo, Jinwei Fan
Proceedings Volume 8916, 89161U (2013) https://doi.org/10.1117/12.2035684
KEYWORDS: Inspection, Failure analysis, Diagnostics, Chemical oxygen iodine lasers, Control systems, Sensors, Safety, Photonic integrated circuits, Electromagnetism, Digital signal processing

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