Junjie Chen
at UCLA Samueli School of Engineering
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2024 Presentation
Proceedings Volume PC12885, PC128850Q (2024) https://doi.org/10.1117/12.3000659
KEYWORDS: Defect detection, Millimeter wave sensors, Terahertz radiation, Terahertz spectroscopy, Spectroscopy, Sensors, Visual process modeling, Visual optics, Target detection, Statistical modeling

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