Dr. Kyoung-Il Lee Profile

Dr. Kyoung-Il Lee

at Korea Electronics Technology Institute

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 28 April 2017 Paper

Current calibration algorithm for bolometer-type uncooled infrared image sensor using pipeline signal processing

Sang-Hwan Kim, Byoung-Soo Choi, Chang-Woo Oh, Jang-Kyoo Shin, Jae-Hyun Park, Kyoung-Il Lee

Proceedings Volume 10209, 102091B (2017) https://doi.org/10.1117/12.2266431

KEYWORDS: Bolometers, Calibration, Infrared imaging, Image sensors

Read Abstract +

In this paper, we propose a pixel averaging current calibration algorithm for reducing fixed pattern noise due to the deviation of bolometer resistance. To reduce fixed pattern noise (FPN), averaging current calibration algorithm by which output current of each bolometer reference pixel is averaged by the averaging current calibration is suggested. The principle of algorithm is that average dark current of reference pixel array is subtracted by a dark current of each active pixel array. After that, the current difference with information of pixel deviation is converted to voltage signal through signal processing. To control the current difference of pixel deviation, a proper calibration current is required. Through this calibration algorithm, nano-ampere order dark currents with small deviations can be obtained. Sensor signal processing is based on a pipeline technique which results in parallel processing leading to very high operation. The proposed calibration algorithm has been implemented by a chip which is consisted of a bolometer active pixel array, a bolometer reference pixel array, average current generators, line memories, buffer memories, current-to-voltage converters (IVCs), a digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Proposed bolometerresistor pixel array and readout circuit has been simulated and fabricated by 0.35μm standard CMOS process.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years