Kirsten L. Brookshire
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 December 2013 Paper
Proceedings Volume 8923, 89231V (2013) https://doi.org/10.1117/12.2033802
KEYWORDS: Thin films, Gallium arsenide, Plasma enhanced chemical vapor deposition, Temperature metrology, Cryogenics, Diodes, Silicon, Thermography, Calibration, Profilometers

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