Ms. Kirsten L. Brookshire Profile

Kirsten L. Brookshire

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Publications (1)

Proceedings Article | 7 December 2013 Paper

Cryogenic optical profilometry for the calculation of coefficient of thermal expansion in thin films

Kirsten Brookshire, Ramin Rafiei, Mariusz Martyniuk, K. K. M. B. Dilusha Silva, John Bumgarner, Robert Basedow, Yinong Liu, Lorenzo Faraone

Proceedings Volume 8923, 89231V (2013) https://doi.org/10.1117/12.2033802

KEYWORDS: Thin films, Gallium arsenide, Plasma enhanced chemical vapor deposition, Temperature metrology, Cryogenics, Diodes, Silicon, Thermography, Calibration, Profilometers

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