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Konrad Mundinger
at dida Datenschmiede GmbH
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Publications (1)
Proceedings Article | 14 March 2023 Presentation + Paper
Deep-learning-based visual inspection of facets and p-sides for efficient quality control of diode lasers
Christof Zink, Michael Ekterai, Dominik Martin, William Clemens, Angela Maennel, Konrad Mundinger, Lorenz Richter, Paul Crump, Andrea Knigge
Proceedings Volume 12403, 124030E (2023) https://doi.org/10.1117/12.2648691
KEYWORDS: Semiconductor lasers, Semiconducting wafers, Education and training, Defect detection, Data modeling, Object detection, Image processing, Deep learning, Optical alignment
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