Dr. Kris Frutschy
at GE Research
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 March 2010 Paper
Kris Frutschy, Bogdan Neculaes, Lou Inzinna, Antonio Caiafa, Joe Reynolds, Yun Zou, Xi Zhang, Satish Gunturi, Yang Cao, Bill Waters, Dave Wagner, Bruno De Man, Dan McDevitt, Rick Roffers, Brian Lounsberry, Norbert Pelc
Proceedings Volume 7622, 76221H (2010) https://doi.org/10.1117/12.843743
KEYWORDS: X-rays, Control systems, X-ray imaging, Electron beams, Fluctuations and noise, Radiography, X-ray sources, Sensors, Prototyping, X-ray computed tomography

Proceedings Article | 13 March 2009 Paper
Kris Frutschy, Bruno De Man, Pete Edic, Brian Lounsberry, Bogdan Neculaes, Yun Zou, Lou Inzinna, Ken Conway, Xi Zhang, Yang Cao, Satish Gunturi, Antonio Caiafa, Joe Reynolds
Proceedings Volume 7258, 725822 (2009) https://doi.org/10.1117/12.812043
KEYWORDS: X-rays, Electron beams, X-ray sources, X-ray imaging, Control systems, Sensors, Medical imaging, Temperature metrology, X-ray computed tomography, X-ray detectors

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