Prof. Kun Gao
at Univ. Sci. Tech. China
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 20 September 2017
OE, Vol. 56, Issue 09, 094110, (September 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.9.094110
KEYWORDS: X-rays, Phase shift keying, X-ray imaging, Picosecond phenomena, Phase modulation, Phase measurement, Sensors, Refraction, X-ray diffraction, X-ray detectors

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