Dr. Liudvikas Augulis
Associate Professor at Kaunas Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 April 2001 Paper
Sigitas Tamulevicius, Liudvikas Augulis, Giedrius Laukaitis
Proceedings Volume 4413, (2001) https://doi.org/10.1117/12.425439
KEYWORDS: Thin films, Interferometers, Optical testing, Mirrors, Speckle pattern, Cameras, Thin film deposition, Reflectivity, Prisms, Semiconductors

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