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Long Chen
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Publications (2)
Proceedings Article | 23 January 2023 Paper
Determination the characteristic parameter of nano-film based on spectroscopic ellipsometry by improved adaptive genetic algorithm
Chong Yue, YueQing Ding, Lei Tao, Sen Zhou, Long Chen
Proceedings Volume 12556, 125561Q (2023) https://doi.org/10.1117/12.2651860
KEYWORDS: Genetic algorithms, Optimization (mathematics), Ellipsometry, Refractive index, Thin films, Spectroscopic ellipsometry, Reflection, Silicon films, Silicon, Polarization
Proceedings Article | 23 January 2023 Paper
Determination of bimetallic film’s thickness and optical constants based on SPR phase detection
Chong Yue, Yueqing Ding, Lei Tao, Sen Zhou, Long Chen
Proceedings Volume 12556, 125561P (2023) https://doi.org/10.1117/12.2651767
KEYWORDS: Metals, Thin films, Prisms, Multilayers, Reflectivity, Surface plasmons, Spiral phase plates, Spectroscopy, Phase shift keying, Inverse problems
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