Louis K. Scheffer
Sales Rep at Cadence Design Systems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 May 2005 Paper
Proceedings Volume 5756, (2005) https://doi.org/10.1117/12.605371
KEYWORDS: Computer aided design, Manufacturing, Lithography, Tolerancing, Design for manufacturing, Particles, Metals, Design for manufacturability, Failure analysis, Scattering

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