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Dr. Marcelo F. Goffman
at Commissariat à l'Energie Atomique
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Publications (1)
Proceedings Article | 4 September 2008 Paper
High frequency carbon nanotube devices
M. Goffman, N. Chimot, E. Mile, M. Monteverde, J.-P. Bourgoin, V. Derycke
Proceedings Volume 7037, 703702 (2008) https://doi.org/10.1117/12.794169
KEYWORDS: Transistors, Electrodes, Carbon nanotubes, Fourier transforms, Atomic force microscopy, Measurement devices, Semiconductors, Dielectrophoresis, Scanning electron microscopy, Aluminum
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