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Marco Bellini
at Georgia Institute of Technology
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Publications (1)
Proceedings Article | 8 June 2007 Paper
1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
Marco Bellini, Peng Cheng, Aravind Appaswamy, John Cressler, Jin Cai
Proceedings Volume 6600, 66000H (2007) https://doi.org/10.1117/12.724678
KEYWORDS: Thin films, Doping, Temperature metrology, Resistance, Oxides, Thin film devices, Silicon, Interference (communication), Germanium, Interfaces
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