Mariana E. Farías Anguiano
at Centro de Investigaciones en Óptica AC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 December 2009 Paper
Proceedings Volume 7499, 749912 (2009) https://doi.org/10.1117/12.849076
KEYWORDS: Aluminum, Nondestructive evaluation, Interferometry, Microelectromechanical systems, Digital signal processing, Charge-coupled devices, MATLAB, Speckle pattern, Modulation, Collimation

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