Massimo D. Sardo
at STMicroelectronics
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 25 July 2024 Paper
I. Abu, F. Gianotti, M. Lodi, G. Malaspina, M. De Benedetto, F. Fiordoliva, M. Costi, G. Mancini, M. Sardo, M. Rosi, A. Bulgarelli, L. Castaldini, A. Tacchini, V. Conforti, A. Costa, V. Fioretti, S. Gallozzi, F. Lucarelli, K. Munari, N. Parmiggiani, V. Pastore, F. Russo, S. Scuderi, G. Tosti, M. Trifoglio
Proceedings Volume 13101, 131013B (2024) https://doi.org/10.1117/12.3018971
KEYWORDS: Printed circuit board testing, Telescopes, Data storage, Atmospheric Cherenkov telescopes, Data acquisition, Computing systems, Reliability, Observatories, Data transmission, Astronomy

Proceedings Article | 25 July 2024 Paper
F. Gianotti, I. Abu, M. Lodi, A. Tacchini, G. Malaspina, M. De Benedetto, F. Fiordoliva, M. Costi, G. Mancini, D. Gregori, M. Pinetti, M. Sardo, D. Fuzzati, M. Rosi, D. Obbi, P. Bruno, A. Bulgarelli, L. Castaldini, V. Conforti, A. Costa, V. Fioretti, S. Gallozzi, C. Grivel, F. Incardona, G. Leto, F. Lucarelli, K. Munari, N. Parmiggiani, V. Pastore, F. Russo, S. Scuderi, G. Tosti, M. Trifoglio
Proceedings Volume 13101, 1310136 (2024) https://doi.org/10.1117/12.3018973
KEYWORDS: Printed circuit board testing, Telescopes, Switches, Connectors, Control systems, Internet, Data acquisition, Data centers, Cameras, Atmospheric Cherenkov telescopes

Proceedings Article | 5 April 2007 Paper
Massimo Sardo, Audrey Berthoud, Jean-Claude Royer, Christian Kusch
Proceedings Volume 6518, 65181B (2007) https://doi.org/10.1117/12.702978
KEYWORDS: Atomic force microscopy, Carbon, Oxides, Transmission electron microscopy, Silicon, Logic, Image processing, Manufacturing, Statistical analysis, Semiconducting wafers

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