Michael Meijers
at ASTRON
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 25 July 2008 Paper
O. Krause, S. Birkmann, T. Blümchen, A. Böhm, M. Ebert, U. Grözinger, Th. Henning, R. Hofferbert, A. Huber, D. Lemke, R.-R. Rohloff, S. Scheithauer, T. Gross, G. Luichtel, C. Stein, R. Stott, M. Übele, J. Amiaux, J.-L. Auguères, A. Glauser, A. Zehnder, M. Meijers, R. Jager, P. Parr-Burrman, G. Wright
Proceedings Volume 7018, 701824 (2008) https://doi.org/10.1117/12.789319
KEYWORDS: Interfaces, James Webb Space Telescope, Kinematics, Cryogenics, Position sensors, Sensors, Mid-IR, Magnetism, Spectroscopy, Optical filters

Proceedings Article | 21 September 2007 Paper
Proceedings Volume 6676, 66760J (2007) https://doi.org/10.1117/12.733843
KEYWORDS: Optical alignment, Source mask optimization, Tolerancing, Spectroscopy, Optics manufacturing, Mirrors, Sensors, Mechanical engineering, Optical components, Image quality

Proceedings Article | 12 September 2007 Paper
Michael Meijers, Ad Oudenhuysen, Ton Schoenmaker, Gabby Kroes, Rieks Jager, Evert Pauwels
Proceedings Volume 6692, 66920K (2007) https://doi.org/10.1117/12.733829
KEYWORDS: Source mask optimization, Spectroscopy, Image quality, Mirrors, Zemax, Wavefronts, James Webb Space Telescope, Sensors, Error analysis, Performance modeling

Proceedings Article | 22 June 2006 Paper
Michael Meijers, Rieks Jager, Gabby Kroes, Lilian Leusink, Ad Oudenhuysen, Evert Pauwels
Proceedings Volume 6271, 62710H (2006) https://doi.org/10.1117/12.670228
KEYWORDS: Systems engineering, Spectroscopy, Source mask optimization, Optical design, Interfaces, Failure analysis, Optical components, Process engineering, Functional analysis, Mid-IR

Proceedings Article | 31 August 2005 Paper
Proceedings Volume 5877, 58770P (2005) https://doi.org/10.1117/12.614784
KEYWORDS: Mirrors, Source mask optimization, Optics manufacturing, Prototyping, Tolerancing, Spectroscopy, Optical components, Interfaces, Optical mounts, Sensors

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