Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31μm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free data
communication systems.
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