Prof. Morten Kildemo Profile

Prof. Morten Kildemo

at Norwegian Univ of Science and Technology

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Author

Publications (9)

SPIE Journal Paper | 25 February 2015 Open Access

Combined imaging of oxidative stress and microscopic structure reveals new features in human atherosclerotic plaques

Magnus Lilledahl, Håkan Gustafsson, Pål Gunnar Ellingsen, Helene Zachrisson, Martin Hallbeck, Vegard Hagen, Morten Kildemo, Mikael Lindgren

JBO, Vol. 20, Issue 02, 020503, (February 2015) https://doi.org/10.1117/12.10.1117/1.JBO.20.2.020503

KEYWORDS: Second-harmonic generation, Collagen, Electronic imaging, Inflammation, Oxygen, Optical microscopy, Microscopy, Crystals, Physics, X band

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SPIE Journal Paper | 6 February 2014 Open Access

Mueller matrix three-dimensional directional imaging of collagen fibers

Pål Ellingsen, Lars Martin Aas, Vegard Hagen, Rajesh Kumar, Magnus Lilledahl, Morten Kildemo

JBO, Vol. 19, Issue 02, 026002, (February 2014) https://doi.org/10.1117/12.10.1117/1.JBO.19.2.026002

KEYWORDS: 3D image processing, Collagen, Second-harmonic generation, Optical fibers, Tissues, Polarization, Brain-machine interfaces, Commercial off the shelf technology, Birefringence, Diffraction

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SPIE Journal Paper | 1 November 2011 Open Access

Quantitative characterization of articular cartilage using Mueller matrix imaging and multiphoton microscopy

Pal Ellingsen, Magnus Lilledahl, Lars Martin Aas, Catharina de Lange Davies, Morten Kildemo

JBO, Vol. 16, Issue 11, 116002, (November 2011) https://doi.org/10.1117/12.10.1117/1.3643721

KEYWORDS: Collagen, Cartilage, Optical fibers, Multiphoton microscopy, Brain-machine interfaces, Polarization, Second-harmonic generation, Tissues, Anisotropy, Imaging systems

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Proceedings Article | 27 May 2011 Paper

Mueller matrix imaging of plasmonic polarizers on nanopatterned surface

Lars Martin Aas, Ingar Stian Nerbø, Morten Kildemo, Daniele Chiappe, Christian Martella, Francesco Buatier de Mongeot

Proceedings Volume 8082, 80822W (2011) https://doi.org/10.1117/12.889585

KEYWORDS: Gold, Polarizers, Nanoparticles, Polarization, Plasmonics, Silica, Ion beams, Nanostructures, Anisotropy, Sputter deposition

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Proceedings Article | 27 May 2011 Paper

Mueller matrix imaging of nematic textures in colloidal dispersions of Na-fluorohectorite synthetic clay

Morten Kildemo, Lars M. S. Aas, Pål Ellingsen, Henrik Hemmen, Elisabeth Hansen, Jon Fossum

Proceedings Volume 8082, 808221 (2011) https://doi.org/10.1117/12.889569

KEYWORDS: Particles, Imaging systems, Polarization, Birefringence, Image transmission, Cameras, Polysomnography, Image processing, Light scattering, Image resolution

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SPIE Journal Paper | 1 July 2008

Well-conditioned multiple laser Mueller matrix ellipsometer

Frantz Stabo-Eeg, Morten Kildemo, Ingar Nerbo, Mikael Lindgren

OE, Vol. 47, Issue 07, 073604, (July 2008) https://doi.org/10.1117/12.10.1117/1.2957047

KEYWORDS: Spatial light modulators, Calibration, Matrices, Condition numbers, Polarization, Liquid crystals, Polarizers, Optical engineering, Mueller matrices, Sensors

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Proceedings Article | 9 May 2007 Paper

Characterisation of liquid crystals for broadband optimal design of Mueller matrix ellipsometers

J. Ladstein, M. Kildemo, G. Svendsen, I. Nerbø, F. Stabo-Eeg

Proceedings Volume 6587, 65870D (2007) https://doi.org/10.1117/12.722590

KEYWORDS: Wave plates, Switching, Liquid crystals, Crystals, Polysomnography, Condition numbers, Polarizers, Near infrared, Sensors, Polarization

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SPIE Journal Paper | 1 September 1999

Measurement of physical thicknesses in micromachined structures consisting of glass and c-Si, by Fourier transform infrared

Morten Kildemo, V. Dalsrud, O. Fostad

OE, Vol. 38, Issue 09, (September 1999) https://doi.org/10.1117/12.10.1117/1.602205

KEYWORDS: Glasses, Reflectivity, Refractive index, Semiconducting wafers, Dielectrics, Oscillators, FT-IR spectroscopy, Dispersion, Reflection, Inspection

Proceedings Article | 19 August 1996 Paper

Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures

Morten Kildemo, S. Deniau, Pavel Bulkin, Bernard Drevillon, Ola Hunderi

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246805

KEYWORDS: Refractive index, Multilayers, Feedback control, Ellipsometry, Optical coatings, Gradient-index optics, Plasma, Modulation, Process control, Reflection

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Showing 5 of 9 publications

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