Dr. Norio Saito
at National Institute of Advanced Industrial Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 April 2019 Paper
Sanghoon Song, Roberto Alonso-Mori, Matthieu Chollet, Yiping Feng, James Glownia, Henrik Lemke, Marcin Sikorski, Diling Zhu, Stefan Moeller, Hae Ja Lee, Mark Hunter, Gabriella Carini, Kai Tiedtke, Ulf Jastrow, Andrey Sorokin, Mathias Richter, Shigeki Owada, Kensuke Tono, Norio Saito, Takahiro Tanaka, Masahiro Kato, Makina Yabashi, Aymeric Robert
Proceedings Volume 11038, 1103810 (2019) https://doi.org/10.1117/12.2520827
KEYWORDS: X-rays, Power meters, Hard x-rays, X-ray detectors, Diagnostics, Free electron lasers

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