Dr. Ofer Nesher Profile

Dr. Ofer Nesher

Electro-Optics director at Elbit Systems Ltd

SPIE Involvement:

Author

Proceedings Article | 26 May 2015 Paper

Low light level CMOS sensor for night vision systems

Elad Gross, Ran Ginat, Ofer Nesher

Proceedings Volume 9451, 945107 (2015) https://doi.org/10.1117/12.2182801

KEYWORDS: Signal to noise ratio, Calibration, Sensors, Image enhancement, Image intensifiers, Image resolution, CMOS sensors, Night vision systems, Image sensors, Quantum efficiency

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Proceedings Article | 18 June 2013 Paper

A novel optical gating method for laser gated imaging

Ran Ginat, Ron Schneider, Eyal Zohar, Ofer Nesher

Proceedings Volume 8704, 87042K (2013) https://doi.org/10.1117/12.2018118

KEYWORDS: Cameras, Imaging systems, Camera shutters, Sensors, Pulsed laser operation, Signal to noise ratio, Mirrors, Microelectromechanical systems, Gated imaging, Backscatter

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Proceedings Article | 7 May 2009 Paper

High resolution 1280×1024, 15 µm pitch compact InSb IR detector with on-chip ADC

O. Nesher, I. Pivnik, E. Ilan, Z. Calalhorra, A. Koifman, I. Vaserman, J. Oiknine Schlesinger, R. Gazit, I. Hirsh

Proceedings Volume 7298, 72983K (2009) https://doi.org/10.1117/12.817054

KEYWORDS: Sensors, Readout integrated circuits, Single crystal X-ray diffraction, Signal processing, Staring arrays, CMOS technology, Infrared detectors, Image resolution, Analog electronics, Signal detection

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Over the last decade, SCD has developed and manufactured high quality InSb Focal Plane Arrays (FPAs), which are currently used in many applications worldwide. SCD's production line includes many different types of InSb FPA with formats of 320x256, 480x384 and 640x512 elements and with pitch sizes in the range of 15 to 30 μm. All these FPAs are available in various packaging configurations, including fully integrated Detector-Dewar-Cooler Assemblies (DDCA) with either closed-cycle Sterling or open-loop Joule-Thomson coolers. With an increasing need for higher resolution, SCD has recently developed a new large format 2-D InSb detector with 1280x1024 elements and a pixel size of 15μm. The InSb 15μm pixel technology has already been proven at SCD with the "Pelican" detector (640x512 elements), which was introduced at the Orlando conference in 2006. A new signal processor was developed at SCD for use in this mega-pixel detector. This Readout Integrated Circuit (ROIC) is designed for, and manufactured with, 0.18 μm CMOS technology. The migration from 0.5 to 0.18 μm CMOS technology supports SCD's roadmap for the reduction of pixel size and power consumption and is in line with the increasing demand for improved performance and on-chip functionality. Consequently, the new ROIC maintains the same level of performance and functionality with a 15 μm pitch, as exists in our 20 μm-pitch ROICs based on 0.5μm CMOS technology. Similar to Sebastian (SCD ROIC with A/D on chip), this signal processor also includes A/D converters on the chip and demonstrates the same level of performance, but with reduced power consumption. The pixel readout rate has been increased up to 160 MHz in order to support a high frame rate, resulting in 120 Hz operation with a window of 1024×1024 elements at ~130 mW. These A/D converters on chip save the need for using 16 A/D channels on board (in the case of an analog ROIC) which would operate at 10 MHz and consume about 8Watts A Dewar has been designed with a stiffened detector support to withstand harsh environmental conditions with a minimal contribution to the heat load of the detector. The combination of the 0.18μm-based low power CMOS technology for the ROIC and the stiffening of the detector support within the Dewar has enabled the use of the Ricor K508 cryo-cooler (0.5 W). This has created a high-resolution detector in a very compact package. In this paper we present the basic concept of the new detector. We will describe its construction and will present electrical and radiometric characterization results.

Proceedings Article | 18 May 2006 Paper

SCD solutions for missile warning system applications

O. Nesher, S. Elkind, G. Francis, M. Kenan

Proceedings Volume 6206, 62061Z (2006) https://doi.org/10.1117/12.662273

KEYWORDS: Sensors, Signal processing, Medium wave, Signal detection, Single crystal X-ray diffraction, Missiles, Staring arrays, Infrared sensors, Infrared detectors, Digital signal processing

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Proceedings Article | 29 September 2005 Paper

High-performance IR detectors at SCD present and future

O. Nesher, P. Klipstein

Proceedings Volume 5957, 59570S (2005) https://doi.org/10.1117/12.623162

KEYWORDS: Sensors, Signal processing, Single crystal X-ray diffraction, Staring arrays, Digital signal processing, Diodes, Mid-IR, Chemical elements, Long wavelength infrared, Signal detection

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Proceedings Article | 6 December 2004 Paper

Advantages of SCD detectors for missile warning system applications

Ofer Nesher, Shimon Elkind, Tuvy Markovitz

Proceedings Volume 5612, (2004) https://doi.org/10.1117/12.580385

KEYWORDS: Sensors, Single crystal X-ray diffraction, Missiles, Signal processing, Medium wave, Infrared technology, Digital signal processing, Electro optics, Infrared imaging, Infrared radiation

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Proceedings Article | 30 August 2004 Paper

480x384 element InSb detector with digital processor

Ofer Nesher, Shimon Elkind, I. Nevo, Tuvy Markovitz, Ayelet Ganany, A. Marhashev, M. Ben-Ezra

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.544508

KEYWORDS: Sensors, Signal processing, Digital signal processing, Field programmable gate arrays, Single crystal X-ray diffraction, Signal detection, Target recognition, Detector development, Target detection, Staring arrays

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Proceedings Article | 30 August 2004 Paper

Piccolo: a high-performance IR detector optimized for handheld applications

Tuvy Markovitz, Fabian Schapiro, D. Alfiya, S. Hasson, A. Magner, Ofer Nesher

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.544520

KEYWORDS: Staring arrays, Nonuniformity corrections, Sensors, Single crystal X-ray diffraction, Cameras, Electronics, Temperature metrology, Infrared detectors, Acoustics, Video

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Proceedings Article | 6 July 2004 Paper

Advanced IR detector design at SCD: from D3C to ABCS

Ofer Nesher, Philip Klipstein, Eliezer Weiss

Proceedings Volume 5359, (2004) https://doi.org/10.1117/12.531401

KEYWORDS: Single crystal X-ray diffraction, Infrared detectors, Sensors, Imaging systems, Signal processing, Laser Doppler velocimetry, Manufacturing, Chemical elements, Staring arrays, Infrared cameras

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Over the past 27 years, SCD has developed and manufactured more than 30 types of Infrared Detector, both with support from the Israeli MOD and in cooperation with institutions and companies such as the Technion, Soreq NRC, RICOR and RAFAEL. SCD's current production line includes Hg_1-xCd_xTe (MCT) devices with up to 480x6 elements operating in Time Delay and Integration (TDI) mode and InSb Focal Plane Arrays (FPAs) with up to 640x512 elements, all available in various configurations including fully integrated Detector-Dewar-Cooler (DDC) packages. Such DDCs have been designed to range from the very small to the very large. At one end the Piccolo DDC is a small, low weight and power detector, ideal for compact low cost imagers such as handheld IR cameras. At the other end, we manufacture a very long (2048x16) bi-directional TDI InSb detector designed for "whiskbroom scanning" systems. This device consists of four modules precisely butted on a single substrate, with each 512x16 module connected to a single signal processor. In 2003, SCD announced its new breakthrough Digital Read Out Integrated Circuit (ROIC) technology: Digital DDC or D³C. This readout system, with excellent performance and increased flexibility is the first in a series of new imaging solutions that SCD is developing to meet future demands of noise and power reduction, combined with greater wavelength selectivity. To continue along this path we have also been developing our new ABCS (Antimonide Based Compound Semiconductor) technology, which we first reported in 2002. The ABCS program, combining SCD's existing strengths in InSb FPA systems with new concepts in bandgap engineering and smart structure design, is aimed at multispectral IR detectors operating at higher temperatures. This review discusses some of the key trends at SCD as described above. After surveying the performance of SCD's current InSb technology, SCD's evolution towards the next generations will be described, including the achievements and potential of the D³C and ABCS systems.

Proceedings Article | 10 October 2003 Paper

Digital cooled InSb detector for IR detection

Ofer Nesher, Shimon Elkind, Amnon Adin, Itsik Nevo, A. Yaakov, S. Raichshtain, Arcadi Marhasev, A. Magner, M. Katz, T. Markovitz, Dan Chen, M. Kenan, A. Ganany, J. Oiknine Schlesinger, Z. Calahorra

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.498154

KEYWORDS: Sensors, Signal processing, Signal detection, Digital signal processing, Field programmable gate arrays, Single crystal X-ray diffraction, Analog electronics, Interference (communication), Infrared sensors, Staring arrays

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Proceedings Article | 23 January 2003 Paper

Performance of BF focal plane array 320x256 InSb detectors

Orna Nesher, Shimon Elkind, Amnon Adin, U. Palty, Oshri Pelleg, Eli Jacobsohn, T. Markovitz, Igor Szafranek, Zipora Calahora, J. Oiknine Schlesinger

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.451313

KEYWORDS: Staring arrays, Sensors, Signal processing, Cadmium sulfide, Single crystal X-ray diffraction, Temperature metrology, Nonuniformity corrections, Capacitors, Curium, Video

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Proceedings Article | 22 December 1998 Paper

Role of interface orientation in the coupling of an anisotropic superconductor with a normal conductor

Emil Polturak, Orna Nesher, Gad Koren

Proceedings Volume 3481, (1998) https://doi.org/10.1117/12.335909

KEYWORDS: Interfaces, Quasiparticles, Superconductors, Diffusion, Superconductivity, Solids, Physics, Temperature metrology, Information operations, Thin films

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Showing 5 of 12 publications

Conference Committee Involvement (5)

Infrared Technology and Applications XXXV

13 April 2009 | Orlando, Florida, United States

Infrared Technology and Applications XXXIV

17 March 2008 | Orlando, Florida, United States

Infrared Technology and Applications XXXIII

9 April 2007 | Orlando, Florida, United States

Infrared Technology and Applications XXXII

17 April 2006 | Orlando (Kissimmee), Florida, United States

Infrared Technology and Applications XXXI

28 March 2005 | Orlando, Florida, United States

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