Ms. Olga Lopatynska Profile

Olga Lopatynska

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Proceedings Article | 6 February 2020 Paper

Influence of elastically-stressed state on polarization and electronic characteristics of amorphous ribbons

Leonid Poperenko, Olga Lopatynska, Iryna Yurgelevych

Proceedings Volume 11369, 1136907 (2020) https://doi.org/10.1117/12.2553469

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Influence of elastically-stressed state on polarization and electronic parameters of Fe- and Ni- based amorphous ribbons were studied by spectroellipsometric method within the infrared hv = 0.2 – 0.6 eV. The ellipsometric parameters Δ and Ψ were measured at for azimuthal directions in own plane of the samples. It was found that dependence of dielectric function is Drude-like one within the infrared for Ni₇₈Si₈B₁₄ ribbon. The parameters of the electronic subsystem, namely plasma frequency ωp and frequency of relaxation γ of the ribbons were found as depending on the azimuthal angle using the functions F₁ – F₃ based on the Drude relationship. These functions are linear dependences on the square of the frequency ω of the incident light or the light wavelength λ. It was found that plasma and relaxation frequencies decrease at two successive azimuthal rotations of the ribbon in its own plane. Consequently, the number of electrons becomes smaller, but the mobility of charge carriers increases. Such difference in the parameters behavior of the electronic subsystem indicates an induced anisotropy of the Ni₇₈Si₈B₁₄ ribbon due to stress in its surface layer. The obtained difference in the behavior of the dependences of the real part of dielectric function ε₁(Е) for both sides of the Fe₇₇Ni₁Si₉B₁₃ ribbon is explained by the specific features of the dynamic characteristics of the conduction electrons with Fermi energy.

Proceedings Article | 27 August 2014 Paper

Deposition condition influence on optical properties of indium tin oxide

Taras Hanulia, Olga Lopatynska, Vasyl Lendel, Leonid Poperenko

Proceedings Volume 9172, 917211 (2014) https://doi.org/10.1117/12.2061185

KEYWORDS: Refractive index, Oxides, Optical properties, Ellipsometry, Indium, Tin, Transparency, Silicon, Thin films, Reflection

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Indium tin oxide (ITO) is a solid solution of indium (III) oxide (In₂O₃) and tin (IV) oxide (SnO₂). It is a typical object for research in modern optoelectronics. This material combines high transparency (in the visible) and conductivity simultaneously. It is used in the production of transparent electrodes of liquid crystal screens and solar cells. The optical properties of thin films of ITO were investigated using ellipsometry. Optical constants of these films were calculated using obtained ellipsometric parameters. Films thicknesses are equal to 21-34 nm, and their refractive indices vary in interval of 2,05-2,12. Also, it was found out how the deposition conditions of ITO films influences their optical properties.

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