Prof. Peter Y. Wong Profile

Prof. Peter Y. Wong

Research Associate Professor at Tufts Univ

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Author

Publications (9)

SPIE Journal Paper | 1 December 2011

Multifiber optical bend sensor to aid colonoscope navigation

Jessica Kesner, Robb Gavalis, Peter Wong, Caroline Cao

OE, Vol. 50, Issue 12, 124402, (December 2011) https://doi.org/10.1117/12.10.1117/1.3656750

KEYWORDS: Sensors, Luminescence, Fiber optics sensors, Spectroscopy, Bandpass filters, Fiber optics, CMOS sensors, Colon, Fluorescence spectroscopy, Semiconductor lasers

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SPIE Journal Paper | 1 June 2010

Localized active-cladding optical fiber bend sensor

Robb Gavalis, Peter Wong, Jessica Eisenstein, Lothar Lilge, Caroline Cao

OE, Vol. 49, Issue 06, 064401, (June 2010) https://doi.org/10.1117/12.10.1117/1.3449110

KEYWORDS: Sensors, Luminescence, Optical fibers, Cladding, Fiber optics sensors, Prototyping, Gas lasers, Quantum dots, Computing systems, Fiber lasers

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Proceedings Article | 22 August 2009 Paper

Optical design of endoscopic shape-tracker using quantum dots embedded in fiber bundles

Jessica Eisenstein, Robb Gavalis, Peter Wong, Caroline G. Cao

Proceedings Volume 7429, 74290X (2009) https://doi.org/10.1117/12.826104

KEYWORDS: Sensors, Luminescence, Colon, Fiber optics sensors, Optical filters, Quantum dots, Cladding, Endoscopy, Cameras, Spectroscopy

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Proceedings Article | 10 April 2008 Paper

Advanced shape tracking to improve flexible endoscopic diagnostics

Caroline G. Cao, Peter Wong, Lothar Lilge, Robb Gavalis, Hua Xing, Nate Zamarripa

Proceedings Volume 6935, 693522 (2008) https://doi.org/10.1117/12.776276

KEYWORDS: Endoscopes, Optical fibers, Luminescence, Quantum dots, Colon, Spectroscopy, Ultraviolet radiation, Sensors, Waveguides, Light sources

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SPIE Journal Paper | 1 October 2001

Spectral imaging, reflectivity measurements, and modeling of iridescent butterfly scale structures

Seth Mann, Ioannis Miaoulis, Peter Wong

OE, Vol. 40, Issue 10, (October 2001) https://doi.org/10.1117/12.10.1117/1.1404431

KEYWORDS: Reflectivity, Thin films, Imaging spectroscopy, Charge-coupled devices, Reflection, Silicon, Scattering, Light scattering, CCD image sensors, Monochromators

SPIE Journal Paper | 1 August 2000

Evaluating the effects of thin film patterns on the temperature distribution of silican wafers during radiant processing

Haruna Tada, Alexis Abramson, Seth Mann, Ioannis Miaoulis, Peter Wong

OE, Vol. 39, Issue 08, (August 2000) https://doi.org/10.1117/12.10.1117/1.1305525

KEYWORDS: Semiconducting wafers, Silicon, Thin films, Silicon films, Reflectivity, Absorption, Lamps, Temperature metrology, Optical engineering, Transparency

SPIE Journal Paper | 1 August 1996

Inelastic effects in a thermoplastic adhesive used for bonding a diamond disk

Cynthia Madras, Peter Wong, Ioannis Miaoulis

OE, Vol. 35, Issue 08, (August 1996) https://doi.org/10.1117/12.10.1117/1.600790

KEYWORDS: Adhesives, Temperature metrology, Polymers, Diamond, Zinc, Thermal modeling, Time metrology, Solids, Optical engineering, Crystals

SPIE Journal Paper | 1 June 1995

Coherent thermal radiation effects on temperature-dependent emissivity of thin-film structures on optically thick substrates

Peter Wong, Christopher Hess, Ioannis Miaoulis

OE, Vol. 34, Issue 06, (June 1995) https://doi.org/10.1117/12.10.1117/12.203137

KEYWORDS: Silicon, Silicon films, Thin films, Semiconducting wafers, Multilayers, Temperature metrology, Radiation effects, Wafer-level optics, Absorption, Oxides

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Proceedings Article | 15 February 1994 Paper

Real-time image analysis and control of the solid/liquid interface during zone-melting recrystallization of thin films

Peter Wong, Ioannis Miaoulis

Proceedings Volume 2091, (1994) https://doi.org/10.1117/12.167356

KEYWORDS: Interfaces, Gallium, Image analysis, Crystals, Process control, Image processing, Thin films, Solids, Light sources and illumination, Silicon films

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Showing 5 of 9 publications

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