The controls by optical mean of coatings deposited on optical components are generally made with flat witnesses. But
when the components are spherical or aspherical, like lenses or mirrors, the spectral response can vary because of the
nonuniformity of thickness that is really linked to the deposition process. For large radius of curvature, control can be
achieved even with classical spectrophotometers. However, control becomes more and more difficult when the radius of
curvature decreases or when the optical device has a complex shape such as slicers for example. So to perform this kind
of measurement, special devices are needed.
The CEA Ripault has designed a new facility of measurements of spectral reflection. This reflectometer can be used to
measure optical coating with a very high accuracy on steeply curved parts. The aim of this paper is to enhance the limits
of this device by studying measurement uncertainty and giving some examples of measurement. One of our most
relevant measurements is the study of an aspheric condenser having a 38 mm focal length. Furthermore, the obtained
reflectivity on an angle iron will be achieved and commented. Soon, WINLIGHT SYSTEM Company will manufacture
this device.
The reflector's specifications of amplifying section of LMJ need to have spectral high-precision reflectance measurements. The innovative solution proposes to increase the precision of reflectance measurements, and to enable measure of pieces in form like spherical mirrors. This activity has been beginning for months and improvements have been performed.
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