Dr. Pierre Rohr Profile

Dr. Pierre Rohr

PRD at Trixell

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 16 March 2020 Paper

Dual layer x-ray detector simulation

Klaus Juergen Engel, Bernd Menser, Pierre Rohr, Walter Ruetten, Matthias Simon, Axel Thran

Proceedings Volume 11312, 113121O (2020) https://doi.org/10.1117/12.2549633

KEYWORDS: Photons, Sensors, X-rays, X-ray detectors, Monte Carlo methods, Iodine, Scattering, Absorption, Mass attenuation coefficient, Signal detection

Read Abstract +

Proceedings Article | 9 March 2018 Paper

Latest advancements in state-of-the-art aSi-based x-ray flat panel detectors

Thierry Ducourant, Thibaut Wirth, Guillaume Bacher, Bruno Bosset, Jean-Michel Vignolle, David Blanchon, Farid Betraoui, Pierre Rohr

Proceedings Volume 10573, 105735V (2018) https://doi.org/10.1117/12.2291908

KEYWORDS: Sensors, X-rays, X-ray detectors, Photodiodes, Reliability, Fluoroscopy, Field emission displays, Amorphous silicon, Quantum efficiency, Spatial resolution

Read Abstract +

Proceedings Article | 22 March 2010 Paper

Fluoroscopic x-ray demonstrator using a CdTe polycrystalline layer coupled to a CMOS readout chip

M. Arques, S. Renet, A. Brambilla, G. Feuillet, A. Gasse, N. Billon-Pierron, M. Jolliot, L. Mathieu, P. Rohr

Proceedings Volume 7622, 76221K (2010) https://doi.org/10.1117/12.843825

KEYWORDS: X-rays, X-ray imaging, Modulation transfer functions, Sensors, Photoresistors, Capacitors, X-ray detectors, Indium, Amplifiers, Absorption

Read Abstract +

Proceedings Article | 19 March 2008 Paper

Reduced inter-exposure time in dual-energy imaging: a technological and image processing cooperative approach

Christopher Coello, Jean-Marc Dinten, Marc Arques, Pierre Rohr, Christophe Odet

Proceedings Volume 6913, 691357 (2008) https://doi.org/10.1117/12.770414

KEYWORDS: Denoising, Signal attenuation, Image filtering, Dual energy imaging, Sensors, Switches, Signal to noise ratio, Interference (communication), Calibration, Bone

Read Abstract +

Proceedings Article | 16 March 2007 Paper

Dual-energy technique for digital flat-panel detectors without x-ray tube voltage switching

Christopher Coello, Jean-Marc Dinten, Marc Arques, Pierre Rohr, Christophe Odet

Proceedings Volume 6510, 651005 (2007) https://doi.org/10.1117/12.707355

KEYWORDS: Sensors, X-rays, Denoising, Dual energy imaging, X-ray detectors, Switching, Switches, X-ray imaging, Image filtering, Tissues

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years