Rachel Liu
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 July 2016 Paper
Hsiao-Wei Liu, Yu-Ying Lan, Han-Wen Lee, Ding-Kun Liu
Proceedings Volume 10011, 100110X (2016) https://doi.org/10.1117/12.2242965
KEYWORDS: Inspection, Optical inspection, Machine vision, Defect inspection, Image enhancement, Defect detection, Cameras, Binary data, Detection and tracking algorithms, Signal attenuation

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