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Dr. Robert R. Keller
at National Institute of Standards and Technology
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Publications (1)
Proceedings Article | 4 March 2019 Paper
A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope
Benjamin Caplins, Jason Holm, Robert Keller
Proceedings Volume 10932, 109320E (2019) https://doi.org/10.1117/12.2508694
KEYWORDS: Sensors, Diffraction, Graphene, Scanning electron microscopy, Photons, Digital micromirror devices, Crystals, Quantum efficiency, Electron microscopes, Electron beams
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