Dr. Scott A. McHugo Profile

Dr. Scott A. McHugo

Principal Engineer at Skyline Solar Inc

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 17 June 2003 Paper

Characterization of failure mechanisms for oxide VCSELs

Scott McHugo, A. Krishnan, Joachim Krueger, Yong Luo, Ningxia Tan, Tim Osentowski, Suning Xie, Myrna Mayonte, Robert Herrick, Qing Deng, Mike Heidecker, David Eastley, Mark Keever, Christophe Kocot

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482637

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical inspection, Failure analysis, Electroluminescence, Reliability, Metals, Contamination, Humidity, Transmission electron microscopy

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Proceedings Article | 17 June 2003 Paper

Reliability and failure mechanisms of oxide VCSELs in nonhermetic environments

Suning Xie, Robert Herrick, Gregory De Brabander, Wilson Widjaja, Uli Koelle, An-Nien Cheng, Laura Giovane, Frank Hu, Mark Keever, Tim Osentowski, Scott McHugo, Myrna Mayonte, Seongsin Kim, Danielle Chamberlin, S. Jeffrey Rosner, Grant Girolami

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.480281

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Humidity, Failure analysis, Semiconducting wafers, Electroluminescence, Transmission electron microscopy, Semiconductors, Oxidation

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Proceedings Article | 17 June 2003 Paper

Studies of ESD-related failure patterns of Agilent oxide VCSELs

Joachim Krueger, Reena Sabharwal, Scott McHugo, Kimanh Nguyen, Ningxia Tan, Naginder Janda, Myrna Mayonte, Mike Heidecker, David Eastley, Mark Keever, Christopher Kocot

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482632

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Failure analysis, Electroluminescence, Transmission electron microscopy, Reverse modeling, Fiber optics, Modulation, Semiconducting wafers, Resistance

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Proceedings Article | 5 January 2001 Paper

Characterization of the focal quality of micron-size beams from x-ray mirrors and zone plates

Albert Thompson, James Underwood, Erik Anderson, Scott McHugo, Barry Lai

Proceedings Volume 4145, (2001) https://doi.org/10.1117/12.411640

KEYWORDS: X-rays, Mirrors, Zone plates, X-ray optics, Luminescence, Silicon, Titanium, Nickel, X-ray characterization, Light sources

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Conference Committee Involvement (1)

High and Low Concentrator Systems for Solar Electric Applications IV

3 August 2009 | San Diego, California, United States

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