A microchannel plate (MCP) is a glass-based, advanced multi-channel electron multiplier. We have developed a new type of hexagonal-tapered MCP that exhibits excellent characteristics, including cusp-free and a large open area ratio (OAR > 92%). The lifetime of MCPs is critical for their applications. In this paper, we investigate the lifetime of the hexagonal-tapered MCP using the Vacuum Photoelectron Imaging Test Facility (VPIT). The results indicate that the MCP achieved a lifetime (accumulated output charge) of over 6.7 coulombs, with a stable output current between 3.0 and 3.5 microamperes for a continuous electron multiplication period exceeding 2.0 × 106 seconds. Furthermore, after undergoing longevity testing, the electronic gain of the single MCP exceeded 10,000 at a bias voltage of 1000 volts, while the dark current remained below 0.5 picoamperes.
A microchannel plate (MCP) is an essential device for multiplying charged particles, and its open area ratio (OAR) is a critical factor that influences its collection efficiency. In this paper, we utilized the Vacuum Photoelectron Imaging Test Facility (VPIT) and a scanning electron microscope (SEM) to study the tip discharge phenomenon and the surface morphology of the MCP. Through innovative material design and optimization of the microchannel structure, we have successfully developed a new type of MCP with an exceptionally high OAR of over 92%. This new MCP addresses the tip discharge issues commonly found in traditional funnel-shaped designs with large OARs. Testing of the single MCP demonstrated an electronic gain exceeding 28,000 at a bias voltage of 1000V, with no fixed pattern noise detected. Additionally, the dark current measured less than 0.05 pA.
Microchannel plate (MCP) is an advanced charged particle multiplier consisted of an arrayed microchannels glass-based material, widely used in the fields of night vision intensification, time of flight mass spectrometer, and electron microscopy. For the detection of high-energy ions, inadequate resistance of ion bombardment became the main bottleneck of microchannel plate. The cladding glass was the inner-wall of microchannels and determined the foundation of the microchannel plate. In this paper, the microchannel plate with (SrO, ZrO2) doped lead-silicate cladding glass was explored in the ion bombardment-resistant properties. Cesium ion gun, laser confocal microscope, and Vacuum Photoelectron Imaging Test Facility (VPIT) were applied to investigate the ion etching, surface morphology and the lifetime of the lead-silicate glass microchannel plate, respectively. The test results are as follows: the accumulative output charge of microchannel plate with the (SrO, ZrO2) doped lead-silicate glass and the traditional lead-silicate glass was ≥19.25 C and 3.21 C, respectively. It impacted that (SrO, ZrO2) doped lead-silicate glass certainly benefited the working life of the MCP.
Microchannel plate (MCP) is an important charged particle electronic multiplier. Usually, electrons as the charged particles entered the input-end and strike the inner wall of the microchannel, producing an electron multiplication. Once the input particles changed into high-energy ions, colliding and sputtering effects would occur in the secondary electron multiplication generation processing of directly bombard on the microchannel plate. A poor ion bombardment-resistance property became the main bottleneck for the detection of high-energy ions of microchannel plate. In this paper, the (SrO, ZrO2) doped lead-silicate glass was as the cladding glass of microchannel plate and explored in the ion bombardment-resistant properties. Argon/cesium ion gun and laser confocal microscope were applied to investigate the ion etching and etching surface morphology of the lead-silicate glass microchannel plate, respectively. It impacted that (SrO, ZrO2) doped lead-silicate glass certainly benefited the ion-bombardment resistance of the MCP.
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