Mr. Shih Hao Wang Profile

Shih Hao Wang

at National Taipei Univ of Technology

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Proceedings Article | 26 September 2011 Paper

Using a single anisotropic thin film as a phase retarder for oblique incident wave

Yi-Jun Jen, Shih-Hao Wang, Chia-Feng Lin, Meng-Jie Lin

Proceedings Volume 8104, 81040A (2011) https://doi.org/10.1117/12.894338

KEYWORDS: Thin films, Reflectivity, Wave plates, Polarization, Interfaces, Wave propagation, Phase shift keying, Tantalum, Modulation, Electromagnetic radiation

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This work presents a wide angle phase retarder by using a single anisotropic Ta₂O₅ columnar thin film. The single anisotropic Ta₂O₅ columnar thin film can provide phase retardation between two tangential eigenvectors to modulate the polarization state of light reflected from the prism-coupling system (BK7 prism/anisotropic thin film/air). In experiment, glancing angle deposition technique is used to prepare single layer film of Ta₂O₅ tilted nanorod array with thickness 270nm. In this analysis, we use wave tracing based on the Berreman calculus to calculate the variations of phases of eigen-waves in the anisotropic thin film as the electromagnetic wave is incident to the prism-coupling system. The uniform phase retardation can be observed in a wide angle range. A linearly polarized incident ray can be reflected as a specific elliptical polarized ray uniformly over the range. Similarly, the wide angle and broadband polarization conversion reflectance with high efficiency also exists in the single anisotropic Ta₂O₅ columnar thin film. The single anisotropic Ta₂O₅ columnar thin film can be useful for the further application in optical components design.

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