Shuhui Zhao
at China Jiliang Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 October 2018 Paper
Proceedings Volume 10823, 1082313 (2018) https://doi.org/10.1117/12.2327048
KEYWORDS: Silver, Nanoparticles, Surface enhanced Raman spectroscopy, Raman spectroscopy, Quantitative analysis, Silicon, Semiconducting wafers, Molecules, Metals, Scanning electron microscopy

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