Dr. Shunsuke Yokozeki Profile

Dr. Shunsuke Yokozeki

Retired

SPIE Involvement:

Author

Publications (25)

Proceedings Article | 22 June 2015 Paper

Influence of error sources in speckle interferometry using only two speckle patterns

Y. Arai, S. Yokozeki

Proceedings Volume 9525, 95250W (2015) https://doi.org/10.1117/12.2182643

KEYWORDS: Speckle, Speckle pattern, Speckle interferometry, Digital holography, Fringe analysis, Interference (communication), Interferometry, Signal processing, Light sources, Signal to noise ratio

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Proceedings Article | 11 September 2012 Paper

Speckle interferometry based on spatial fringe analysis method using only two speckle patterns

Yasuhiko Arai, Takuya Inoue, Shunsuke Yokozeki

Proceedings Volume 8413, 84130F (2012) https://doi.org/10.1117/12.975753

KEYWORDS: Speckle pattern, Fringe analysis, Phase shifts, Speckle interferometry, Speckle, Interferometry, Charge-coupled devices, High speed cameras, Light scattering, Cameras

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Proceedings Article | 11 August 2008 Paper

A dynamic in-plane deformation measurement using virtual speckle patterns

Yasuhiko Arai, Ryouich Shimamura, Shunsuke Yokozeki

Proceedings Volume 7063, 70630A (2008) https://doi.org/10.1117/12.791982

KEYWORDS: Speckle pattern, Fringe analysis, Speckle, Cameras, Fourier transforms, High speed cameras, Speckle interferometry, Metals, Optical spheres, Camera shutters

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Proceedings Article | 15 September 2006 Paper

Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 6341, 63410K (2006) https://doi.org/10.1117/12.695287

KEYWORDS: Speckle pattern, Cameras, Speckle, Fringe analysis, Speckle interferometry, Phase shifting, Interferometry, Optical alignment, Photography, Phase shifts

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Proceedings Article | 14 August 2006 Paper

High resolution deformation measurement method using one sheet of specklegram

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 6292, 62921A (2006) https://doi.org/10.1117/12.678171

KEYWORDS: Speckle pattern, Speckle, Fringe analysis, Charge-coupled devices, Speckle interferometry, Amplifiers, Mirrors, Surface plasmons, Electronic filtering, Linear filtering

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Proceedings Article | 7 March 2006 Paper

Estimation of inside stress of microcantilever: investigation of measuring principle using macro-model

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498436

KEYWORDS: Shape analysis, Finite element methods, Moire patterns, Motion analysis, Statistical analysis, Fringe analysis, Optical testing, Stress analysis, Polonium, Error analysis

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Proceedings Article | 19 August 2005 Paper

Development of fringe analysis method for image in ESPI using single sheet of specklegram

Y. Arai, S. Yokozeki

Proceedings Volume 5880, 588004 (2005) https://doi.org/10.1117/12.615846

KEYWORDS: Fringe analysis, Speckle pattern, Speckle, Speckle interferometry, Image analysis, Phase measurement, Copper, Image processing, 3D metrology

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Proceedings Article | 13 June 2005 Paper

Development of measurement of microstructure using moiré topography in SEM

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.612442

KEYWORDS: Scanning electron microscopy, Electrons, 3D metrology, Sensors, Electron beams, Scattering, Spatial resolution, Backscatter, Cameras, Optical testing

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SPIE Journal Paper | 1 September 2004

In-plane displacement measurement using electronic-speckle-pattern-interferometry-based on spatial fringe analysis method

Yasuhiko Arai, Shunsuke Yokozeki

OE, Vol. 43, Issue 09, (September 2004) https://doi.org/10.1117/12.10.1117/1.1778731

KEYWORDS: Bandpass filters, Speckle, Fringe analysis, Image filtering, Optical filters, Optical testing, Interference (communication), Image processing, Interferometry, Charge-coupled devices

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Proceedings Article | 2 August 2004 Paper

Using a sheet of specklegram: the development of fringe analysis method for ESPI

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.560333

KEYWORDS: Speckle pattern, Speckle, Glasses, Fringe analysis, Phase measurement, Fourier transforms, Linear filtering, Photography, Image filtering

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Proceedings Article | 30 May 2003 Paper

Control of phase of fringes in speckle interferometry for application of fringe scanning methods

Yasuhiko Arai, Shunshuke Yokozeki

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.498854

KEYWORDS: Speckle pattern, Speckle, Fringe analysis, Image filtering, Speckle interferometry, Bandpass filters, Image processing, Image analysis, Linear filtering, Control systems

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Proceedings Article | 18 October 2002 Paper

Investigation using communication theory in spatial fringe analysis method

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.467248

KEYWORDS: Fringe analysis, Communication theory, Modulation, Phase shift keying, CCD image sensors, Shape analysis, Interferometers, Glasses, Bessel functions, Phase measurement

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Proceedings Article | 19 June 2002 Paper

In-plane displacement measurement using ESPI based on spatial fringe analysis method

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 4778, (2002) https://doi.org/10.1117/12.473555

KEYWORDS: Bandpass filters, Image filtering, Speckle, Fringe analysis, Optical filters, Interference (communication), Electronic filtering, Linear filtering, Speckle pattern, Charge-coupled devices

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SPIE Journal Paper | 1 November 2001

Improvement of measuring accuracy of spatial fringe analysis method using Kalman filter and its application

Yasuhiko Arai, Shunsuke Yokozeki

OE, Vol. 40, Issue 11, (November 2001) https://doi.org/10.1117/12.10.1117/1.1410103

KEYWORDS: Fringe analysis, Filtering (signal processing), Digital filtering, Speckle, Signal processing, Image processing, Image analysis, Signal to noise ratio, Interferometers, Error analysis

Proceedings Article | 23 October 2001 Paper

Electronic speckle pattern interferometry based on spatial fringe analysis method

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445547

KEYWORDS: Speckle, Speckle pattern, Fringe analysis, Charge-coupled devices, Interference (communication), Modulation, Computer simulations, CCD cameras, Bandpass filters, Mirrors

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Proceedings Article | 8 May 2001 Paper

Automatic collimation system by Talbot interferometry

Shinya Haramaki, Shunsuke Yokozeki, Akihiro Hayashi, Hiroshi Suzuki

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427092

KEYWORDS: Collimation, Moire patterns, Interferometry, Collimators, Interferometers, Diffraction gratings, Signal detection, Computing systems, Systems engineering, Optical testing

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Proceedings Article | 13 August 1999 Paper

Spatial fringe analysis method in ESPI

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357717

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Proceedings Article | 30 June 1998 Paper

Displacement measurement for vibration with large amplitude using moire topography

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312957

KEYWORDS: Moire patterns, Fringe analysis, Vibrometry, Shape analysis, Error analysis, 3D metrology, Charge-coupled devices, Camera shutters, Optical testing, Image processing

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Proceedings Article | 17 September 1997 Paper

Experimental modal analysis for vibration with large amplitude using moire topography

Yasuhiko Arai, Shunsuke Yokozeki, Kazuhiro Shiraki

Proceedings Volume 3098, (1997) https://doi.org/10.1117/12.281158

KEYWORDS: Moire patterns, Fringe analysis, Modal analysis, Computing systems, Image analysis, Vibrometry, 3D metrology, Holographic interferometry, Light sources, Control systems

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SPIE Journal Paper | 1 September 1997

High-speed two-dimensional fringe analysis using frequency demodulation

Yasuhiko Arai, Shunsuke Yokozeki, Tomoharu Yamada

OE, Vol. 36, Issue 09, (September 1997) https://doi.org/10.1117/12.10.1117/1.601476

KEYWORDS: Fringe analysis, Charge-coupled devices, Demodulation, Image processing, Computing systems, Signal detection, Interferometers, Quantization, Analog electronics, Computer simulations

Proceedings Article | 18 September 1996 Paper

High-speed two-dimensional fringe analysis using frequency demodultion

Yasuhiko Arai, Shunsuke Yokozeki, Kazuhiro Shiraki, Tomoharu Yamada

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250766

KEYWORDS: Fringe analysis, Demodulation, Digital signal processing, Digital electronics, Digital electronic circuits, Charge-coupled devices, Image processing, Prototyping

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SPIE Journal Paper | 1 August 1996

Learning optimization of morphological filters with gray scale structuring elements

Akira Asano, Tohru Yamashita, Shunsuke Yokozeki

OE, Vol. 35, Issue 08, (August 1996) https://doi.org/10.1117/12.10.1117/1.600827

KEYWORDS: Image filtering, Digital filtering, Binary data, Neurons, Nonlinear filtering, Mathematical morphology, Neural networks, Algorithms, Image processing, Optical engineering

SPIE Journal Paper | 1 August 1996

High-speed fringe analysis method using frequency demodulation technology

Yasuhiko Arai, Shunsuke Yokozeki, Kazuhiro Shiraki, Tomoharu Yamada

OE, Vol. 35, Issue 08, (August 1996) https://doi.org/10.1117/12.10.1117/1.600821

KEYWORDS: Fringe analysis, Charge-coupled devices, CCD image sensors, Image processing, Interferometers, Demodulation, Data processing, Analog electronics, Signal processing, Optical amplifiers

Proceedings Article | 12 December 1994 Paper

High-speed fringe analysis method using frequency demodulation technology

Yasuhiko Arai, Shunsuke Yokozeki, Tomoharu Yamada

Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195903

KEYWORDS: Fringe analysis, Charge-coupled devices, Image processing, CCD image sensors, Data processing, Demodulation, Interferometers, Analog electronics, Clocks, Signal processing

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Proceedings Article | 1 December 1991 Paper

Three-dimensional automatic precision measurement system by liquid-crystal plate on moire topography

Yasuhiko Arai, Shunsuke Yokozeki, Tomoharu Yamada

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57496

KEYWORDS: Moire patterns, Liquid crystals, Fringe analysis, Binary data, 3D metrology, Holographic interferometry, Mechanics, Optical spheres, Precision measurement, 3D displays

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Showing 5 of 25 publications

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