CONFERENCE PROCEEDINGS
Advanced Search
Prof. Simon Zabler
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 5 October 2023 Presentation + Paper
Correlative microscopy using SEM based nano-CT
Jonas Fell, Fabian Lutter, Christoph Pauly, Michael Engstler, Feng Han, Rémi Costa, Simon Zabler, Michael Maisl, Frank Mücklich, Randolf Hanke, Hans-Georg Herrmann
Proceedings Volume 12698, 1269805 (2023) https://doi.org/10.1117/12.2677235
KEYWORDS: X-rays, Scanning electron microscopy, X-ray detectors, Aluminum, X-ray imaging, Electrodes, Annealing, X-ray microscopy
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top