Taisaku Nakata
at DNP Fine Electronics Sagamihara Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 March 2008 Paper
Takashi Murakami, Taisaku Nakata, Kensuke Taniguchi, Takayuki Uchiyama, Megumi Jyousaka, Masahide Tadokoro, Yoshitaka Konishi
Proceedings Volume 6922, 692210 (2008) https://doi.org/10.1117/12.771548
KEYWORDS: Critical dimension metrology, Etching, Lithography, Logic devices, Temperature metrology, Electronics, Reticles, Semiconducting wafers, Control systems, Chemical vapor deposition

Proceedings Article | 3 April 2007 Paper
Taisaku Nakata, Teruhiko Kodama, Motofumi Komori, Naka Onoda, Takayuki Uchiyama
Proceedings Volume 6519, 65190I (2007) https://doi.org/10.1117/12.711108
KEYWORDS: Interfaces, Immersion lithography, Thin film coatings, Logic devices, Lithography, Liquids, Photoresist processing, Water, Optical lithography, Electronics

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