Prof. Te-Won Lee
at Univ of California San Diego
SPIE Involvement:
Author | Instructor
Publications (3)

Proceedings Article | 9 April 2007 Paper
Proceedings Volume 6576, 657602 (2007) https://doi.org/10.1117/12.725192
KEYWORDS: Independent component analysis, Spherical lenses, Mica, Modeling, Signal processing, Performance modeling, Data modeling, Solid state lighting, Detection and tracking algorithms, Lanthanum

Proceedings Article | 13 November 2003 Paper
Te-Won Lee, Gil-Jin Jang, Oh-Wook Kwon
Proceedings Volume 5207, (2003) https://doi.org/10.1117/12.506153
KEYWORDS: Independent component analysis, Signal processing, Speech recognition, Computer programming, Data modeling, Electronic filtering, Feature extraction, Databases, Principal component analysis, Wavelets

Proceedings Article | 4 December 2000 Paper
Te-Won Lee, Michael Lewicki
Proceedings Volume 4119, (2000) https://doi.org/10.1117/12.408633
KEYWORDS: Independent component analysis, Data modeling, Image segmentation, Image classification, Image processing, Image compression, Image processing algorithms and systems, Computer programming, Performance modeling, Systems modeling

Conference Committee Involvement (4)
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX
27 April 2011 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VIII
7 April 2010 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VII
13 April 2009 | Orlando, Florida, United States
Independent Component Analyses, Wavelets, Unsupervised Nano-Biomimetic Sensors and Neural Networks VI
17 March 2008 | Orlando, Florida, United States
Course Instructor
SC715: Independent Component Analysis and Beyond: Blind Signal Processing and its Applications
Blind Signal Processing (BSP) is an emerging area of research and technology with solid theoretical foundations and many potential applications. The problems of separating or extracting of the source signals from sensor arrays, without knowledge of the transmission channel characteristics and the real sources, can be expressed briefly as a number of blind source separation (BSS) or related generalized component analysis (GCA) methods: Independent Component Analysis (ICA) (and its extensions), Sparse Component Analysis (SCA), Sparse Principal Component Analysis (SPCA), Non-negative Matrix Factorization (NMF), Time-Frequency Component Analyzer (TFCA) and Multichannel Blind Deconvolution (MBD). BSP is not limited to ICA or BSS. With BSP we aim to discover and validate principles or laws which govern relationships between inputs (hidden components) and outputs (observations) when the information about the propagation Multi-Input Multi-Output (MIMO) system and its inputs are limited or hindered. BSP incorporates many problems, like blind identification of channels of unknown systems or a problem of suitable decomposition of signals into basic latent (hidden) components which do not necessary represent true sources but rather some of their features or sub-components. This four-hour course presents the fundamentals of blind signal processing, especially blind source separation and extraction, and in the remaining time discusses their applications in several important signal processing areas including estimation of sources, novel enhancement, denoising, artifact removal, filtering, detection, classification of multi-sensory signals and data, especially in biomedical applications and Brain Computer Interface (BCI).
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