Thomas Hirsiger
at Berner Fachhochschule Technik und Informatik
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2020 Presentation + Paper
Proceedings Volume 11267, 112670T (2020) https://doi.org/10.1117/12.2543948
KEYWORDS: Copper, Silicon, Picosecond phenomena, Metals, Surface roughness, Photomicroscopy, Scanning electron microscopy, Materials processing, Particles, Surface finishing

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