Uttam Nandi
at Technische Univ Darmstadt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2022 Presentation + Paper
Proceedings Volume 12021, 1202104 (2022) https://doi.org/10.1117/12.2609787
KEYWORDS: Semiconducting wafers, Terahertz radiation, Refractive index, Silicon, Spectroscopy, Fabry–Perot interferometers

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