Wenwei Zhou
at Nanjing Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 November 2018 Paper
Proceedings Volume 10819, 108191M (2018) https://doi.org/10.1117/12.2500884
KEYWORDS: Neural networks, Convolution, Fourier transforms, 3D metrology, Projection systems, Bandpass filters, Electronic filtering, Cameras, Fringe analysis, Modulation

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