A method for joint transmission line and aperture field integration (TL-AFIM) is proposed and utilized to efficiently compute the near-field distribution of the finite-sized multilayered dielectric plates. Four indicators Epv, Erms, φpv, and φrms representing the amplitude and phase variations are proposed to evaluate the near-field uniformity. A multilayered dielectric plate containing three dielectric layers is analyzed and evaluated by TL-AFIM. Compared to the commonly used multilevel fast multipole method (MLFMM), the memory requirement and CPU time consumption are drastically reduced from 61.3 GB and 20.2 h to 4.4 MB and 2.5 s, respectively. The calculation accuracy is better than 90%.
Phase diversity (PD), proposed by Gonsalves, is a kind of wavefront sensing technique based on measurement of two or
more images of object. The optical system involved is relatively simple. It makes use of the methods of optimization and
image processing, which can jointly estimate phase aberration as well as object itself simultaneously. The most
significant characteristic of this technique is that it works well with extended scenes. Steepest descent method and
conjugate gradient method both are preferable algorithms for nonlinear optimization. As a matter of fact, any one of two
methods has some limitations. Steepest descent method is a local property and conjugate gradient method's convergence
rate is slow. Combining two methods to develop a mixed algorithm, we can avoid entrapping into a local minimum and
raise global convergence rate. Simulation results demonstrate that the hybrid algorithm has the features of quick
convergence rate, comparatively large convergence range, which make the method of phase diversity remarkably robust
and numerically efficient.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.