Mr. Xiyun He Profile

Xiyun He

at Shanghai Institute of Ceramics

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 8 December 2004 Paper

Influence of process parameters on fabrication of PZT(53/47) thick films by a dip-coating process

Xiyun He, Yong Zhang, Pingsun Qiu, Aili Ding

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607370

KEYWORDS: Ferroelectric materials, Dielectrics, Semiconducting wafers, Titanium, Scanning electron microscopy, Ceramics, Platinum, Electrodes, System on a chip, Roads

Read Abstract +

Proceedings Article | 8 December 2004 Paper

Fabrication and characteristics of PLZT thin films derived from MOD process

Yong Zhang, Xiyun He, Pingsun Qiu, Aili Ding

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607367

KEYWORDS: Thin films, Sapphire, Transmittance, Silicon, Refractive index, Optical properties, Polarization, Crystals, Lead, Atomic force microscopy

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Preparation of PZT thick films by 0-3 composite method

Xiyun He, Aili Ding, Pingsun Qiu, Weigen Luo

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408334

KEYWORDS: Ferroelectric materials, Composites, Dielectrics, Annealing, Ceramics, Sol-gels, Scanning electron microscopy, Crystals, Coating, X-ray diffraction

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Preparation and properties of IrO2 thin films grown by dc magnetron reactive sputtering method

Shijun Wang, Aili Ding, Pingsun Qiu, Xiyun He, Weigen Luo

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408293

KEYWORDS: Thin films, Sputter deposition, Electrodes, Ferroelectric materials, Capacitors, Thin film deposition, Oxides, Crystals, Scanning electron microscopy, Thin film growth

Read Abstract +

Proceedings Article | 29 November 2000 Paper

Synthesis, dielectric characteristic, and microstructure of acetate-based (Ba,Sr)TiO3 thin films

Huyong Tian, Weigen Luo, Xinghua Pu, Pingsun Qiu, Xiyun He, Aili Ding

Proceedings Volume 4086, (2000) https://doi.org/10.1117/12.408338

KEYWORDS: Thin films, Crystals, Dielectrics, Sol-gels, Temperature metrology, Capacitance, Ferroelectric materials, FT-IR spectroscopy, Metals, Perovskite

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years