Dr. Yi Bae Choi Profile

Dr. Yi Bae Choi

at INTEKPLUS Co Ltd

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 29 December 1998 Paper

Two-frequency phase-shifting projection moire topography

Seung-Woo Kim, Jung-Taek Oh, Moon-Sik Jung, Yi-Bae Choi

Proceedings Volume 3520, (1998) https://doi.org/10.1117/12.334348

KEYWORDS: Moire patterns, Phase shifts, Reflectivity

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SPIE Journal Paper | 1 March 1998

Phase-shifting grating projection moire topography

Yi-Bae Choi, Seung-Woo Kim

OE, Vol. 37, Issue 03, (March 1998) https://doi.org/10.1117/12.10.1117/1.601934

KEYWORDS: Phase shifts, Fringe analysis, Optical design, Image processing, Reflectivity, Phase measurement, Charge-coupled devices, Phase shifting, Electromagnetic radiation, Interferometry

Proceedings Article | 21 March 1997 Paper

Projection moire for 3D inspection of printed circuit boards

Seung-Woo Kim, Yi-Bae Choi, Jung-Taek Oh

Proceedings Volume 3023, (1997) https://doi.org/10.1117/12.269750

KEYWORDS: Moire patterns, Phase shifts, Inspection, Calibration, Sensors, Phase shifting, 3D metrology, Image processing, Spatial frequencies, CCD cameras

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Proceedings Article | 20 January 1997 Paper

Three-dimensional profile measurement of fine objects by phase-shifting shadow moire interferometry

Seung-Woo Kim, Yi-Bae Choi, Jung-Taek Oh

Proceedings Volume 2909, (1997) https://doi.org/10.1117/12.263330

KEYWORDS: Phase shifts, Deflectometry, Phase shifting, Moire patterns, Inspection, Phase measurement, Calibration, 3D metrology, Sensors, Interferometry

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