Yasser Almehio
at Institut d'Électronique Fondamentale
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 February 2010 Paper
Yasser Almehio, Samia Bouchafa
Proceedings Volume 7532, 75320B (2010) https://doi.org/10.1117/12.840027
KEYWORDS: Image registration, Image processing, Reliability, Feature extraction, Image segmentation, Onboard cameras, Motion analysis, Computer programming, Light sources and illumination, Pattern recognition

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